Information card for entry 4075784
| Formula |
C32 H34 Si2 |
| Calculated formula |
C32 H34 Si2 |
| SMILES |
[Si](C)(C)(C)C1([Si](C)(C)C2(C)c3ccccc3c3ccccc23)c2ccccc2c2ccccc12 |
| Title of publication |
Difluorenylsilanes, -germanes, and -stannanes Exhibiting an Unprecedented Parallel Arrangement of the Fluorene Units |
| Authors of publication |
Nemes, Gabriela Cretiu; Silaghi-Dumitrescu, Luminita; Silaghi-Dumitrescu, Ioan; Escudié, Jean; Ranaivonjatovo, Henri; Molloy, Kieran C.; Mahon, Mary F.; Zukerman-Schpector, Julio |
| Journal of publication |
Organometallics |
| Year of publication |
2005 |
| Journal volume |
24 |
| Journal issue |
6 |
| Pages of publication |
1134 |
| a |
9.916 ± 0.0002 Å |
| b |
15.678 ± 0.0004 Å |
| c |
16.978 ± 0.0005 Å |
| α |
90° |
| β |
92.202 ± 0.001° |
| γ |
90° |
| Cell volume |
2637.5 ± 0.12 Å3 |
| Cell temperature |
150 ± 2 K |
| Ambient diffraction temperature |
150 ± 2 K |
| Number of distinct elements |
3 |
| Space group number |
14 |
| Hermann-Mauguin space group symbol |
P 1 21/n 1 |
| Hall space group symbol |
-P 2yn |
| Residual factor for all reflections |
0.0834 |
| Residual factor for significantly intense reflections |
0.0471 |
| Weighted residual factors for significantly intense reflections |
0.0981 |
| Weighted residual factors for all reflections included in the refinement |
0.1136 |
| Goodness-of-fit parameter for all reflections included in the refinement |
1.013 |
| Diffraction radiation wavelength |
0.71069 Å |
| Diffraction radiation type |
MoKα |
| Has coordinates |
Yes |
| Has disorder |
No |
| Has Fobs |
No |
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