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Information card for entry 4075790
Preview
Coordinates | 4075790.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C63 H74 Cl2 Cr F25 N2 |
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Calculated formula | C63 H74 Cl2 Cr F25 N2 |
SMILES | [Cr](c1c(F)c(F)c(F)c(F)c1F)(c1c(F)c(F)c(F)c(F)c1F)(c1c(F)c(F)c(F)c(F)c1F)(c1c(F)c(F)c(F)c(F)c1F)c1c(F)c(F)c(F)c(F)c1F.[N+](CCCC)(CCCC)(CCCC)CCCC.[N+](CCCC)(CCCC)(CCCC)CCCC.C(Cl)Cl |
Title of publication | A New Geometry for Homoleptic Organochromium Compounds |
Authors of publication | Alonso, Pablo J.; Forniés, Juan; García-Monforte, M. Angeles; Martín, Antonio; Menjón, Babil |
Journal of publication | Organometallics |
Year of publication | 2005 |
Journal volume | 24 |
Journal issue | 6 |
Pages of publication | 1269 |
a | 11.8742 ± 0.0006 Å |
b | 43.994 ± 0.002 Å |
c | 12.5591 ± 0.0006 Å |
α | 90° |
β | 96.715 ± 0.001° |
γ | 90° |
Cell volume | 6515.8 ± 0.5 Å3 |
Cell temperature | 100 ± 2 K |
Ambient diffraction temperature | 100 ± 2 K |
Number of distinct elements | 6 |
Space group number | 14 |
Hermann-Mauguin space group symbol | P 1 21/n 1 |
Hall space group symbol | -P 2yn |
Residual factor for all reflections | 0.064 |
Residual factor for significantly intense reflections | 0.0388 |
Weighted residual factors for significantly intense reflections | 0.0603 |
Weighted residual factors for all reflections included in the refinement | 0.0637 |
Goodness-of-fit parameter for all reflections included in the refinement | 0.964 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/4075790.html
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Users of the data should acknowledge the original authors of the
structural data.