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Information card for entry 4075833
Preview
Coordinates | 4075833.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C24 H33 N2 P Pb Si2 |
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Calculated formula | C24 H33 N2 P Pb Si2 |
SMILES | C1=c2ccccn2[Pb](N([Si](C)(C)C)[Si](C)(C)C)[P]1(c1ccccc1)c1ccccc1 |
Title of publication | A Heterotopically Chelated Low-Valent Lead Amide1 |
Authors of publication | Murso, Alexander; Straka, Michal; Kaupp, Martin; Bertermann, Rüdiger; Stalke, Dietmar |
Journal of publication | Organometallics |
Year of publication | 2005 |
Journal volume | 24 |
Journal issue | 14 |
Pages of publication | 3576 |
a | 8.5944 ± 0.0015 Å |
b | 17.482 ± 0.003 Å |
c | 18.411 ± 0.003 Å |
α | 102.425 ± 0.003° |
β | 96.536 ± 0.003° |
γ | 95.131 ± 0.003° |
Cell volume | 2665.3 ± 0.8 Å3 |
Cell temperature | 100 ± 2 K |
Ambient diffraction temperature | 100 ± 2 K |
Number of distinct elements | 6 |
Space group number | 2 |
Hermann-Mauguin space group symbol | P -1 |
Hall space group symbol | -P 1 |
Residual factor for all reflections | 0.0206 |
Residual factor for significantly intense reflections | 0.0179 |
Weighted residual factors for significantly intense reflections | 0.0405 |
Weighted residual factors for all reflections included in the refinement | 0.0412 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.085 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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The link is: https://www.crystallography.net/4075833.html
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