Information card for entry 4076784

Structure parameters

• Formula: C33 H46 O2 Si2 W
• Calculated formula: C33 H46 O2 Si2 W
• SMILES: [W]1234(=[Si](c5c(cc(cc5C)C)C)c5c(cc(cc5C)C)C)([Si](C)(C)C)(C#[O])(C#[O])[c]5([c]1([c]2([c]3([c]45C)C)C)C)C
• Title of publication: Synthesis of Self-Stabilized and Donor-Free Silyl(silylene)tungsten Complexes
• Authors of publication: Ueno, Keiji; Asami, Satsuki; Watanabe, Nobuhiko; Ogino, Hiroshi
• Journal of publication: Organometallics
• Year of publication: 2002
• Journal volume: 21
• Journal issue: 7
• Pages of publication: 1326
• a: 11.3632 ± 0.0006 Å
• b: 19.1125 ± 0.0009 Å
• c: 15.1675 ± 0.0007 Å
• α: 90°
• β: 101.969 ± 0.0017°
• γ: 90°
• Cell volume: 3222.5 ± 0.3 ų
• Cell temperature: 150 ± 2 K
• Ambient diffraction temperature: 150 ± 2 K
• Number of distinct elements: 5
• Space group number: 14
• Hermann-Mauguin space group symbol: P 1 21/n 1
• Hall space group symbol: -P 2yn
• Residual factor for all reflections: 0.0444
• Residual factor for significantly intense reflections: 0.0353
• Weighted residual factors for significantly intense reflections: 0.0897
• Weighted residual factors for all reflections included in the refinement: 0.0947
• Goodness-of-fit parameter for all reflections included in the refinement: 1.23
• Diffraction radiation wavelength: 0.71073 Å
• Diffraction radiation type: MoKα
• Has coordinates: Yes
• Has disorder: No
• Has Fobs: No