Information card for entry 4077616

Structure parameters

• Formula: C21 H54 Cu P3 Si Te
• Calculated formula: C21 H54 Cu P3 Si Te
• SMILES: [Te]([Cu]([P](CC)(CC)CC)([P](CC)(CC)CC)[P](CC)(CC)CC)[Si](C)(C)C
• Title of publication: Synthesis and Characterization of Tris(trialkylphosphine)copper(I)trimethylsilylchalcogenolates
• Authors of publication: Tran, Diem T. T.; Corrigan, John F.
• Journal of publication: Organometallics
• Year of publication: 2000
• Journal volume: 19
• Journal issue: 24
• Pages of publication: 5202
• a: 16.5294 ± 0.0003 Å
• b: 12.0854 ± 0.0002 Å
• c: 16.9309 ± 0.0003 Å
• α: 90°
• β: 115.671 ± 0.001°
• γ: 90°
• Cell volume: 3048.36 ± 0.1 ų
• Cell temperature: 200 ± 2 K
• Ambient diffraction temperature: 200 ± 2 K
• Number of distinct elements: 6
• Space group number: 14
• Hermann-Mauguin space group symbol: P 1 21/n 1
• Hall space group symbol: -P 2yn
• Residual factor for all reflections: 0.0384
• Residual factor for significantly intense reflections: 0.0334
• Weighted residual factors for significantly intense reflections: 0.083
• Weighted residual factors for all reflections included in the refinement: 0.0865
• Goodness-of-fit parameter for all reflections included in the refinement: 1.056
• Diffraction radiation wavelength: 0.71073 Å
• Diffraction radiation type: MoKα
• Has coordinates: Yes
• Has disorder: No
• Has Fobs: No