Information card for entry 4077700

Structure parameters

• Formula: C48 H50 Si2
• Calculated formula: C48 H50 Si2
• SMILES: [Si@@]1([Si@]2(C)c3cc(cc(c3c3cccc(c23)c2c(cc(cc2C)C)C)C)C)(C)c2cc(cc(c2c2cccc(c12)c1c(cc(cc1C)C)C)C)C.[Si@]1([Si@@]2(C)c3cc(cc(c3c3cccc(c23)c2c(cc(cc2C)C)C)C)C)(C)c2cc(cc(c2c2cccc(c12)c1c(cc(cc1C)C)C)C)C
• Title of publication: Reduction of Terphenyltrifluorosilanes: C−C Insertion Products and Possible Formation of a Disilyne
• Authors of publication: Pietschnig, Rudolf; West, Robert; Powell, Douglas R.
• Journal of publication: Organometallics
• Year of publication: 2000
• Journal volume: 19
• Journal issue: 14
• Pages of publication: 2724
• a: 8.8406 ± 0.0018 Å
• b: 11.157 ± 0.002 Å
• c: 21.144 ± 0.004 Å
• α: 88.282 ± 0.005°
• β: 82.74 ± 0.003°
• γ: 71.166 ± 0.003°
• Cell volume: 1957.9 ± 0.6 ų
• Cell temperature: 143 ± 2 K
• Ambient diffraction temperature: 143 ± 2 K
• Number of distinct elements: 3
• Space group number: 2
• Hermann-Mauguin space group symbol: P -1
• Hall space group symbol: -P 1
• Residual factor for all reflections: 0.2757
• Residual factor for significantly intense reflections: 0.1186
• Weighted residual factors for significantly intense reflections: 0.2471
• Weighted residual factors for all reflections included in the refinement: 0.3053
• Goodness-of-fit parameter for all reflections included in the refinement: 0.897
• Diffraction radiation wavelength: 0.71073 Å
• Diffraction radiation type: MoKα
• Has coordinates: Yes
• Has disorder: No
• Has Fobs: No