Information card for entry 4080005

Structure parameters

• Formula: C27 H44 N4 Si
• Calculated formula: C27 H44 N4 Si
• SMILES: [Si]1([N](=C(N1C(C)(C)C)c1ccccc1)C(C)(C)C)(N(C)C)=NC12CC3CC(C1)CC(C2)C3
• Title of publication: Reactivity Studies of Heteroleptic Silylenes PhC(NtBu)2SiX (X = NPh2, NMe2) toward Selected Azides
• Authors of publication: Azhakar, Ramachandran; Roesky, Herbert W.; Holstein, Julian J.; Pröpper, Kevin; Dittrich, Birger
• Journal of publication: Organometallics
• Year of publication: 2013
• Journal volume: 32
• Journal issue: 1
• Pages of publication: 358
• a: 17.4541 ± 0.001 Å
• b: 11.4512 ± 0.0007 Å
• c: 13.5293 ± 0.0009 Å
• α: 90°
• β: 103.587 ± 0.004°
• γ: 90°
• Cell volume: 2628.4 ± 0.3 ų
• Cell temperature: 100 ± 2 K
• Ambient diffraction temperature: 100 ± 2 K
• Number of distinct elements: 4
• Space group number: 14
• Hermann-Mauguin space group symbol: P 1 21/c 1
• Hall space group symbol: -P 2ybc
• Residual factor for all reflections: 0.1225
• Residual factor for significantly intense reflections: 0.0974
• Weighted residual factors for significantly intense reflections: 0.2171
• Weighted residual factors for all reflections included in the refinement: 0.2341
• Goodness-of-fit parameter for all reflections included in the refinement: 1.073
• Diffraction radiation wavelength: 1.54178 Å
• Diffraction radiation type: CuKα
• Has coordinates: Yes
• Has disorder: No
• Has Fobs: No