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Information card for entry 4080068
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Coordinates | 4080068.cif |
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Original paper (by DOI) | HTML |
Formula | C37 H59 P2 Rh Si |
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Calculated formula | C37 H59 P2 Rh Si |
SMILES | C1C[P](C(C)(C)C)(C(C)(C)C)[RhH]2([Si](c3ccccc3)(c3ccccc3)(Cc3ccccc3)[H]2)[P]1(C(C)(C)C)C(C)(C)C |
Title of publication | Multiple Si‒H Bond Activations bytBu2PCH2CH2PtBu2andtBu2PCH2PtBu2Di(phosphine) Complexes of Rhodium and Iridium |
Authors of publication | Fasulo, Meg E.; Calimano, Elisa; Buchanan, J. Matthew; Tilley, T. Don |
Journal of publication | Organometallics |
Year of publication | 2013 |
Journal volume | 32 |
Journal issue | 4 |
Pages of publication | 1016 |
a | 13.219 ± 0.01 Å |
b | 13.688 ± 0.01 Å |
c | 21.101 ± 0.016 Å |
α | 90° |
β | 107.489 ± 0.009° |
γ | 90° |
Cell volume | 3642 ± 5 Å3 |
Cell temperature | 105 ± 2 K |
Ambient diffraction temperature | 105 ± 2 K |
Number of distinct elements | 5 |
Space group number | 14 |
Hermann-Mauguin space group symbol | P 1 21/c 1 |
Hall space group symbol | -P 2ybc |
Residual factor for all reflections | 0.0902 |
Residual factor for significantly intense reflections | 0.0422 |
Weighted residual factors for significantly intense reflections | 0.0794 |
Weighted residual factors for all reflections included in the refinement | 0.0981 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.027 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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