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Information card for entry 4083103
Preview
| Coordinates | 4083103.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C52 H53 F24 N O4 Si2 |
|---|---|
| Calculated formula | C52 H53 F24 N O4 Si2 |
| Title of publication | Synthesis and Isolation of a Silylsilicate Containing Two Pentacoordinated Silicon Atoms by Monoprotonation of a Disilicate and Monodeprotonation of a Disilane |
| Authors of publication | Kano, Naokazu; Sasaki, Keishi; Miyake, Hideaki; Kawashima, Takayuki |
| Journal of publication | Organometallics |
| Year of publication | 2014 |
| Journal volume | 33 |
| Journal issue | 9 |
| Pages of publication | 2358 |
| a | 12.567 ± 0.005 Å |
| b | 22.96 ± 0.008 Å |
| c | 19.153 ± 0.008 Å |
| α | 90° |
| β | 99.7765 ± 0.0017° |
| γ | 90° |
| Cell volume | 5446 ± 4 Å3 |
| Cell temperature | 120 ± 2 K |
| Ambient diffraction temperature | 120 ± 2 K |
| Number of distinct elements | 6 |
| Space group number | 14 |
| Hermann-Mauguin space group symbol | P 1 21/n 1 |
| Hall space group symbol | -P 2yn |
| Residual factor for all reflections | 0.1347 |
| Residual factor for significantly intense reflections | 0.0586 |
| Weighted residual factors for significantly intense reflections | 0.1092 |
| Weighted residual factors for all reflections included in the refinement | 0.1391 |
| Goodness-of-fit parameter for all reflections included in the refinement | 0.929 |
| Diffraction radiation wavelength | 0.7107 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | Yes |
| Has Fobs | No |
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The link is: https://www.crystallography.net/4083103.html
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