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Information card for entry 4084420
Preview
Coordinates | 4084420.cif |
---|---|
Original paper (by DOI) | HTML |
Common name | Compound5 |
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Formula | C24 H47 N Ni P Si |
Calculated formula | C24 H47 N Ni P Si |
SMILES | c1(c(cccc1C(C)C)C(C)C)N([Si](C)(C)C)[Ni][P](C(C)C)(C(C)C)C(C)C |
Title of publication | Useful Method for the Preparation of Low-Coordinate Nickel(I) Complexes via Transformations of the Ni(I) Bis(amido) Complex K{Ni[N(SiMe3)(2,6- (i) Pr2-C6H3)]2} |
Authors of publication | Lipschutz, Michael I.; Tilley, T. Don |
Journal of publication | Organometallics |
Year of publication | 2014 |
Journal volume | 33 |
Journal issue | 19 |
Pages of publication | 5566 - 5570 |
a | 11.9515 ± 0.0005 Å |
b | 13.9669 ± 0.0005 Å |
c | 16.9287 ± 0.0007 Å |
α | 90° |
β | 102.477 ± 0.001° |
γ | 90° |
Cell volume | 2759.09 ± 0.19 Å3 |
Cell temperature | 100 ± 2 K |
Ambient diffraction temperature | 100 ± 2 K |
Number of distinct elements | 6 |
Space group number | 14 |
Hermann-Mauguin space group symbol | P 1 21/n 1 |
Hall space group symbol | -P 2yn |
Residual factor for all reflections | 0.0573 |
Residual factor for significantly intense reflections | 0.0383 |
Weighted residual factors for significantly intense reflections | 0.0751 |
Weighted residual factors for all reflections included in the refinement | 0.0829 |
Goodness-of-fit parameter for all reflections included in the refinement | 0.991 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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The link is: https://www.crystallography.net/4084420.html
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