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Information card for entry 4084422
Preview
Coordinates | 4084422.cif |
---|---|
Original paper (by DOI) | HTML |
Common name | Compound7 |
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Formula | C42 H59 N2 Ni O |
Calculated formula | C42 H59 N2 Ni O |
SMILES | c1(c(cc(cc1C(C)(C)C)C)C(C)(C)C)O[Ni]=C1N(C=CN1c1c(cccc1C(C)C)C(C)C)c1c(cccc1C(C)C)C(C)C |
Title of publication | Useful Method for the Preparation of Low-Coordinate Nickel(I) Complexes via Transformations of the Ni(I) Bis(amido) Complex K{Ni[N(SiMe3)(2,6- (i) Pr2-C6H3)]2} |
Authors of publication | Lipschutz, Michael I.; Tilley, T. Don |
Journal of publication | Organometallics |
Year of publication | 2014 |
Journal volume | 33 |
Journal issue | 19 |
Pages of publication | 5566 - 5570 |
a | 18.329 ± 0.005 Å |
b | 19.847 ± 0.005 Å |
c | 20.428 ± 0.005 Å |
α | 109.439 ± 0.005° |
β | 106.744 ± 0.005° |
γ | 96.811 ± 0.005° |
Cell volume | 6518 ± 3 Å3 |
Cell temperature | 100 ± 2 K |
Ambient diffraction temperature | 100 ± 2 K |
Number of distinct elements | 5 |
Space group number | 2 |
Hermann-Mauguin space group symbol | P -1 |
Hall space group symbol | -P 1 |
Residual factor for all reflections | 0.0924 |
Residual factor for significantly intense reflections | 0.0552 |
Weighted residual factors for significantly intense reflections | 0.1287 |
Weighted residual factors for all reflections included in the refinement | 0.1395 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.094 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/4084422.html
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