Information card for entry 4086763

Structure parameters

• Formula: C47 H74 N2 O2 Si W
• Calculated formula: C47 H74 N2 O2 Si W
• SMILES: [W]12345(=[Si](N(C1=NC(C)C)C(C)C)c1c6c(cc7c1C(CC7(CC)CC)(CC)CC)C(CC6(CC)CC)(CC)CC)(C#[O])(C#[O])[c]1([c]5([c]4([c]3([c]21C)C)C)C)C
• Title of publication: A Silylyne Tungsten Complex Having an Eind Group on Silicon: Its Dimer‒Monomer Equilibrium and Cycloaddition Reactions with Carbodiimide and Diaryl Ketones
• Authors of publication: Takashi Yoshimoto; Hisako Hashimoto; Naoki Hayakawa; Tsukasa Matsuo; Hiromi Tobita
• Journal of publication: Organometallics
• Year of publication: 2016
• Pages of publication: 3444 - 3447
• a: 18.5274 ± 0.0003 Å
• b: 13.1587 ± 0.0002 Å
• c: 18.7332 ± 0.0004 Å
• α: 90°
• β: 99.6199 ± 0.0005°
• γ: 90°
• Cell volume: 4502.87 ± 0.14 ų
• Cell temperature: 150 ± 2 K
• Ambient diffraction temperature: 150 ± 2 K
• Number of distinct elements: 6
• Space group number: 14
• Hermann-Mauguin space group symbol: P 1 21/c 1
• Hall space group symbol: -P 2ybc
• Residual factor for all reflections: 0.0871
• Residual factor for significantly intense reflections: 0.0713
• Weighted residual factors for significantly intense reflections: 0.0931
• Weighted residual factors for all reflections included in the refinement: 0.0965
• Goodness-of-fit parameter for all reflections included in the refinement: 1.39
• Diffraction radiation wavelength: 0.71073 Å
• Diffraction radiation type: MoKα
• Has coordinates: Yes
• Has disorder: No
• Has Fobs: No