Information card for entry 4087981

Structure parameters

• Formula: C48 H59 Cr N4 O5 P Si
• Calculated formula: C48 H59 Cr N4 O5 P Si
• SMILES: [Cr](P[Si]1(N(C(=C)C=C(N1c1c(cccc1C(C)C)C(C)C)C)c1c(cccc1C(C)C)C(C)C)[n]1ccc(N(C)C)cc1)(C#[O])(C#[O])(C#[O])(C#[O])C#[O].c1ccccc1C
• Title of publication: Transition Metal Complexes of a “Half-Parent” Phosphasilene Adduct Representing Silylene→Phosphinidene→Metal Complexes
• Authors of publication: Hansen, Kerstin; Szilvási, Tibor; Blom, Burgert; Driess, Matthias
• Journal of publication: Organometallics
• Year of publication: 2015
• Journal volume: 34
• Journal issue: 24
• Pages of publication: 5703
• a: 18.478 ± 0.0003 Å
• b: 17.5211 ± 0.0003 Å
• c: 29.6613 ± 0.0005 Å
• α: 90°
• β: 90°
• γ: 90°
• Cell volume: 9603 ± 0.3 ų
• Cell temperature: 150 ± 2 K
• Ambient diffraction temperature: 150 ± 0.1 K
• Number of distinct elements: 7
• Space group number: 61
• Hermann-Mauguin space group symbol: P b c a
• Hall space group symbol: -P 2ac 2ab
• Residual factor for all reflections: 0.0804
• Residual factor for significantly intense reflections: 0.0533
• Weighted residual factors for significantly intense reflections: 0.1267
• Weighted residual factors for all reflections included in the refinement: 0.1451
• Goodness-of-fit parameter for all reflections included in the refinement: 1.02
• Diffraction radiation probe: x-ray
• Diffraction radiation wavelength: 1.54184 Å
• Diffraction radiation type: CuKα
• Has coordinates: Yes
• Has disorder: No
• Has Fobs: No