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Information card for entry 4102658
Preview
Coordinates | 4102658.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C60 H54 N8 O6 |
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Calculated formula | C60 H54 N8 O6 |
SMILES | C1NC(=O)c2cccc(n2)C(=O)NCc2ccc(CNC(=O)c3cccc(n3)C(=O)NCc3ccc1cc3)cc2.C(CN(=CC=N(CC(c1ccccc1)c1ccccc1)=O)=O)(c1ccccc1)c1ccccc1 |
Title of publication | Nitrone [2]Rotaxanes: Simultaneous Chemical Protection and Electrochemical Activation of a Functional Group |
Authors of publication | Daniel M. D'Souza; David A. Leigh; Loïc Mottier; Kathleen M. Mullen; Francesco Paolucci; Simon J. Teat; Songwei Zhang |
Journal of publication | Journal of the American Chemical Society |
Year of publication | 2010 |
Journal volume | 132 |
Pages of publication | 9465 - 9470 |
a | 14.547 ± 0.004 Å |
b | 11.196 ± 0.003 Å |
c | 16.222 ± 0.004 Å |
α | 90° |
β | 108.408 ± 0.004° |
γ | 90° |
Cell volume | 2506.9 ± 1.1 Å3 |
Cell temperature | 150 ± 2 K |
Ambient diffraction temperature | 150 ± 2 K |
Number of distinct elements | 4 |
Space group number | 14 |
Hermann-Mauguin space group symbol | P 1 21/c 1 |
Hall space group symbol | -P 2ybc |
Residual factor for all reflections | 0.1499 |
Residual factor for significantly intense reflections | 0.1012 |
Weighted residual factors for all reflections | 0.2693 |
Weighted residual factors for significantly intense reflections | 0.2311 |
Goodness-of-fit parameter for all reflections | 1.053 |
Goodness-of-fit parameter for significantly intense reflections | 1.18 |
Diffraction radiation wavelength | 0.6884 Å |
Diffraction radiation type | Synchrotron |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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The link is: https://www.crystallography.net/4102658.html
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