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Information card for entry 4102659
Preview
Coordinates | 4102659.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C66 H72 N10 O10 |
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Calculated formula | C66 H68 N10 O8 |
SMILES | c1(ccccc1)C(c1ccccc1)CN(=CC=N(CC(c1ccccc1)c1ccccc1)=O)=O.C1NC(=O)c2cncc(c2)C(=O)NCc2ccc(CNC(=O)c3cncc(c3)C(=O)NCc3ccc1cc3)cc2.O=CN(C)C.C(=O)N(C)C |
Title of publication | Nitrone [2]Rotaxanes: Simultaneous Chemical Protection and Electrochemical Activation of a Functional Group |
Authors of publication | Daniel M. D'Souza; David A. Leigh; Loïc Mottier; Kathleen M. Mullen; Francesco Paolucci; Simon J. Teat; Songwei Zhang |
Journal of publication | Journal of the American Chemical Society |
Year of publication | 2010 |
Journal volume | 132 |
Pages of publication | 9465 - 9470 |
a | 15.331 ± 0.002 Å |
b | 11.1669 ± 0.0014 Å |
c | 18.44 ± 0.002 Å |
α | 90° |
β | 110.639 ± 0.002° |
γ | 90° |
Cell volume | 2954.3 ± 0.6 Å3 |
Cell temperature | 180 ± 2 K |
Ambient diffraction temperature | 180 ± 2 K |
Number of distinct elements | 4 |
Space group number | 14 |
Hermann-Mauguin space group symbol | P 1 21/n 1 |
Hall space group symbol | -P 2yn |
Residual factor for all reflections | 0.2759 |
Residual factor for significantly intense reflections | 0.0971 |
Weighted residual factors for significantly intense reflections | 0.1735 |
Weighted residual factors for all reflections included in the refinement | 0.2495 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.063 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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The link is: https://www.crystallography.net/4102659.html
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