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Information card for entry 4103335
Preview
Coordinates | 4103335.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C77.5 H83 N2 O3 P2 Si3 Y |
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Calculated formula | C74 H79 N2 O3 P2 Si3 Y |
SMILES | [Y]12(OC(c3ccccc3)(c3ccccc3)C[Si](C)(C)C)(OC3(OC(c4c3cccc4)(c3ccccc3)c3ccccc3)c3ccccc3)[N](=P(C2P(=[N]1[Si](C)(C)C)(c1ccccc1)c1ccccc1)(c1ccccc1)c1ccccc1)[Si](C)(C)C |
Title of publication | Regioselective C-H Activation and Sequential C-C and C-O Bond Formation Reactions of Aryl Ketones Promoted by an Yttrium Carbene |
Authors of publication | David P. Mills; Lyndsay Soutar; William Lewis; Alexander J. Blake; Stephen T. Liddle |
Journal of publication | Journal of the American Chemical Society |
Year of publication | 2010 |
Journal volume | 132 |
Pages of publication | 14379 - 14381 |
a | 13.2474 ± 0.0004 Å |
b | 13.428 ± 0.0004 Å |
c | 22.4888 ± 0.0007 Å |
α | 73.018 ± 0.003° |
β | 77.028 ± 0.003° |
γ | 64.946 ± 0.003° |
Cell volume | 3442.5 ± 0.2 Å3 |
Cell temperature | 90 ± 2 K |
Ambient diffraction temperature | 90 ± 2 K |
Number of distinct elements | 7 |
Space group number | 2 |
Hermann-Mauguin space group symbol | P -1 |
Hall space group symbol | -P 1 |
Residual factor for all reflections | 0.0603 |
Residual factor for significantly intense reflections | 0.0475 |
Weighted residual factors for significantly intense reflections | 0.1179 |
Weighted residual factors for all reflections included in the refinement | 0.1234 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.06 |
Diffraction radiation wavelength | 1.54184 Å |
Diffraction radiation type | CuKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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The link is: https://www.crystallography.net/4103335.html
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