Crystallography Open Database
- COD Home
- Accessing COD Data
- Add Your Data
- Documentation
Information card for entry 4103336
Preview
Coordinates | 4103336.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C59 H62 I N2 O2.5 P2 Si2 Y |
---|---|
Calculated formula | C57 H58 I N2 O2 P2 Si2 Y |
SMILES | I[Y]123(C(P(c4ccccc4)(c4ccccc4)=[N]1[Si](C)(C)C)P(c1ccccc1)(c1ccccc1)=[N]2[Si](C)(C)C)OC(c1ccccc1)(c1ccccc1)c1ccccc1C(=[O]3)c1ccccc1 |
Title of publication | Regioselective C-H Activation and Sequential C-C and C-O Bond Formation Reactions of Aryl Ketones Promoted by an Yttrium Carbene |
Authors of publication | David P. Mills; Lyndsay Soutar; William Lewis; Alexander J. Blake; Stephen T. Liddle |
Journal of publication | Journal of the American Chemical Society |
Year of publication | 2010 |
Journal volume | 132 |
Pages of publication | 14379 - 14381 |
a | 22.828 ± 0.002 Å |
b | 10.4486 ± 0.0011 Å |
c | 26.112 ± 0.003 Å |
α | 90° |
β | 111.67 ± 0.002° |
γ | 90° |
Cell volume | 5788.1 ± 1 Å3 |
Cell temperature | 150 ± 2 K |
Ambient diffraction temperature | 150 ± 2 K |
Number of distinct elements | 8 |
Space group number | 14 |
Hermann-Mauguin space group symbol | P 1 21/c 1 |
Hall space group symbol | -P 2ybc |
Residual factor for all reflections | 0.0668 |
Residual factor for significantly intense reflections | 0.0496 |
Weighted residual factors for significantly intense reflections | 0.124 |
Weighted residual factors for all reflections included in the refinement | 0.13 |
Goodness-of-fit parameter for all reflections included in the refinement | 0.97 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/4103336.html
All data in the COD and the database itself are dedicated to the
public domain and licensed under the
CC0
License
.
Users of the data should acknowledge the original authors of the
structural data.