Information card for entry 4103917

Structure parameters

• Formula: Gd5 P1.25 Si2.75
• Calculated formula: Gd5 P1.24 Si2.76
• Title of publication: Gd5Si4-xPx: Targeted Structural Changes through Increase in Valence Electron Count
• Authors of publication: Volodymyr Svitlyk; Gordon J. Miller; Yurij Mozharivskyj
• Journal of publication: Journal of the American Chemical Society
• Year of publication: 2009
• Journal volume: 131
• Pages of publication: 2367 - 2374
• a: 7.6067 ± 0.0017 Å
• b: 14.645 ± 0.003 Å
• c: 7.6843 ± 0.0016 Å
• α: 90°
• β: 90°
• γ: 90°
• Cell volume: 856 ± 0.3 ų
• Cell temperature: 293 ± 2 K
• Ambient diffraction temperature: 293 ± 2 K
• Number of distinct elements: 3
• Space group number: 62
• Hermann-Mauguin space group symbol: P n m a
• Hall space group symbol: -P 2ac 2n
• Residual factor for all reflections: 0.0824
• Residual factor for significantly intense reflections: 0.0754
• Weighted residual factors for significantly intense reflections: 0.1655
• Weighted residual factors for all reflections included in the refinement: 0.1688
• Goodness-of-fit parameter for all reflections included in the refinement: 1.11
• Diffraction radiation wavelength: 0.71073 Å
• Diffraction radiation type: MoKα
• Has coordinates: Yes
• Has disorder: No
• Has Fobs: No