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Information card for entry 4104971
Preview
Coordinates | 4104971.cif |
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Original paper (by DOI) | HTML |
Formula | C88 H70 N4 Rh2 Si2 |
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Calculated formula | C88 H70 N4 Rh2 Si2 |
SMILES | c1(c2ccccc2)c2c3cccc[n]3[Rh]34([H][Rh]54([H]3)([n]3ccccc3c3c(c4ccccc4)cc(n53)c3ccccc3)[Si](c3ccccc3)(C(C)(C)C)c3ccccc3)(n2c(c2ccccc2)c1)[Si](c1ccccc1)(C(C)(C)C)c1ccccc1.CCOCC.CCOCC |
Title of publication | High Oxidation State Rhodium and Iridium Bis(silyl)dihydride Complexes Supported by a Chelating Pyridyl-Pyrrolide Ligand |
Authors of publication | Jennifer L. McBee; Jose Escalada; T. Don Tilley |
Journal of publication | Journal of the American Chemical Society |
Year of publication | 2009 |
Journal volume | 131 |
Pages of publication | 12703 - 12713 |
a | 11.7915 ± 0.001 Å |
b | 13.4246 ± 0.0011 Å |
c | 13.5335 ± 0.0011 Å |
α | 61.518 ± 0.001° |
β | 68.25 ± 0.001° |
γ | 75.752 ± 0.002° |
Cell volume | 1742.6 ± 0.3 Å3 |
Cell temperature | 150 ± 2 K |
Ambient diffraction temperature | 150 ± 2 K |
Number of distinct elements | 5 |
Space group number | 2 |
Hermann-Mauguin space group symbol | P -1 |
Hall space group symbol | -P 1 |
Residual factor for all reflections | 0.0587 |
Residual factor for significantly intense reflections | 0.046 |
Weighted residual factors for significantly intense reflections | 0.1182 |
Weighted residual factors for all reflections included in the refinement | 0.1234 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.038 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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The link is: https://www.crystallography.net/4104971.html
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