Information card for entry 4105125

Structure parameters

• Formula: C28 H48 O7 Si
• Calculated formula: C28 H48 O7 Si
• SMILES: [Si]1(O[C@@H](C[C@H](O)[C@@](O)([C@H](O1)[C@H](C)COCc1ccccc1)C)C(=O)OC(C)C)(C(C)(C)C)C(C)(C)C.[Si]1(O[C@H](C[C@@H](O)[C@](O)([C@@H](O1)[C@@H](C)COCc1ccccc1)C)C(=O)OC(C)C)(C(C)(C)C)C(C)(C)C
• Title of publication: Insertions of Silylenes into Vinyl Epoxides: Diastereoselective Synthesis of Functionalized, Optically Active trans-Dioxasilacyclooctenes
• Authors of publication: Michel Prévost; K. A. Woerpel
• Journal of publication: Journal of the American Chemical Society
• Year of publication: 2009
• Journal volume: 131
• Pages of publication: 14182 - 14183
• a: 8.2287 ± 0.0006 Å
• b: 18.2598 ± 0.0013 Å
• c: 20.6213 ± 0.0015 Å
• α: 103.53 ± 0.0009°
• β: 90.5933 ± 0.0009°
• γ: 102.354 ± 0.0009°
• Cell volume: 2936.7 ± 0.4 ų
• Cell temperature: 153 ± 2 K
• Ambient diffraction temperature: 153 ± 2 K
• Number of distinct elements: 4
• Space group number: 2
• Hermann-Mauguin space group symbol: P -1
• Hall space group symbol: -P 1
• Residual factor for all reflections: 0.0522
• Residual factor for significantly intense reflections: 0.04
• Weighted residual factors for significantly intense reflections: 0.0991
• Weighted residual factors for all reflections included in the refinement: 0.1058
• Goodness-of-fit parameter for all reflections included in the refinement: 1.022
• Diffraction radiation wavelength: 0.71073 Å
• Diffraction radiation type: MoKα
• Has coordinates: Yes
• Has disorder: No
• Has Fobs: No