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Information card for entry 4105140
Preview
Coordinates | 4105140.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C24 H34 Cl14 Ga4 N2 P10 |
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Calculated formula | C24 H34 Cl14 Ga4 N2 P10 |
SMILES | c1(c(cccc1C(C)C)C(C)C)N1[P+]2(N(c3c(cccc3C(C)C)C(C)C)[P+]31P1P4P3P14)P1P3P2P13.Cl[Ga](Cl)([Cl][Ga](Cl)(Cl)Cl)Cl.Cl[Ga](Cl)(Cl)[Cl][Ga](Cl)(Cl)Cl |
Title of publication | Preparation of the [(DippNP)~2~(P~4~)~2~]^2+^-Dication by the Reaction of [DippNPCl]2 and a Lewis Acid with P~4~ |
Authors of publication | Michael H. Holthausen; Jan J. Weigand |
Journal of publication | Journal of the American Chemical Society |
Year of publication | 2009 |
Journal volume | 131 |
Pages of publication | 14210 - 14211 |
a | 24.2241 ± 0.0017 Å |
b | 11.4374 ± 0.0008 Å |
c | 21.2238 ± 0.0015 Å |
α | 90° |
β | 115.093 ± 0.001° |
γ | 90° |
Cell volume | 5325.3 ± 0.6 Å3 |
Cell temperature | 153 ± 2 K |
Ambient diffraction temperature | 153 ± 1 K |
Number of distinct elements | 6 |
Space group number | 15 |
Hermann-Mauguin space group symbol | C 1 2/c 1 |
Hall space group symbol | -C 2yc |
Residual factor for all reflections | 0.0441 |
Residual factor for significantly intense reflections | 0.0301 |
Weighted residual factors for significantly intense reflections | 0.0691 |
Weighted residual factors for all reflections included in the refinement | 0.0745 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.022 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/4105140.html
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