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Information card for entry 4106760
Preview
Coordinates | 4106760.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C52 H128 K N6 O10 Si8 Tb2 |
---|---|
Calculated formula | C52 H128 K N6 O10 Si8 Tb2 |
SMILES | C[Si](C)([N]([Si](C)(C)C)[Tb]1([N]([Si](C)(C)C)[Si](C)(C)C)([N]2=[N]1[Tb]2([N]([Si](C)(C)C)[Si](C)(C)C)([N]([Si](C)(C)C)[Si](C)(C)C)[O]1CCCC1)[O]1CCCC1)C.[K]12345([O]6CC[O]1CC[O]2CC[O]3CC[O]4CC[O]5CC6)([O]1CCCC1)[O]1CCCC1 |
Title of publication | A N23-Radical-Bridged Terbium Complex Exhibiting Magnetic Hysteresis at 14 K |
Authors of publication | Jeffrey D. Rinehart; Ming Fang; William J. Evans; Jeffrey R. Long |
Journal of publication | Journal of the American Chemical Society |
Year of publication | 2011 |
Journal volume | 133 |
Pages of publication | 14236 - 14239 |
a | 10.2704 ± 0.0004 Å |
b | 13.9728 ± 0.0006 Å |
c | 15.1455 ± 0.0006 Å |
α | 83.3933 ± 0.0005° |
β | 74.0667 ± 0.0005° |
γ | 72.9371 ± 0.0005° |
Cell volume | 1996.57 ± 0.14 Å3 |
Cell temperature | 173 ± 2 K |
Ambient diffraction temperature | 173 ± 2 K |
Number of distinct elements | 7 |
Space group number | 2 |
Hermann-Mauguin space group symbol | P -1 |
Hall space group symbol | -P 1 |
Residual factor for all reflections | 0.0232 |
Residual factor for significantly intense reflections | 0.02 |
Weighted residual factors for significantly intense reflections | 0.0493 |
Weighted residual factors for all reflections included in the refinement | 0.0508 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.037 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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Users of the data should acknowledge the original authors of the
structural data.