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Information card for entry 4112092
Preview
Coordinates | 4112092.cif |
---|---|
Original paper (by DOI) | HTML |
Common name | [Dipp*SnNPh]2.hexane |
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Formula | C78 H98 N2 Sn2 |
Calculated formula | C78 H98 N2 Sn2 |
SMILES | [Sn](N(c1ccccc1)N(c1ccccc1)[Sn]c1c(cccc1c1c(cccc1C(C)C)C(C)C)c1c(cccc1C(C)C)C(C)C)c1c(cccc1c1c(cccc1C(C)C)C(C)C)c1c(cccc1C(C)C)C(C)C.CCCCCC |
Title of publication | Reactions of the Heavier Group 14 Element Alkyne Analogues Ar'EEAr' (Ar' = C6H3-2,6(C6H3-2,6-Pri2)2; E = Ge, Sn) with Unsaturated Molecules: Probing the Character of the EE Multiple Bonds |
Authors of publication | Chunming Cui; Marilyn M. Olmstead; James C. Fettinger; Geoffrey H. Spikes; Philip P. Power |
Journal of publication | Journal of the American Chemical Society |
Year of publication | 2005 |
Journal volume | 127 |
Pages of publication | 17530 - 17541 |
a | 11.9584 ± 0.0019 Å |
b | 27.587 ± 0.005 Å |
c | 20.622 ± 0.003 Å |
α | 90° |
β | 90.114 ± 0.007° |
γ | 90° |
Cell volume | 6803.1 ± 1.9 Å3 |
Cell temperature | 93 ± 2 K |
Ambient diffraction temperature | 93 ± 2 K |
Number of distinct elements | 4 |
Space group number | 4 |
Hermann-Mauguin space group symbol | P 1 21 1 |
Hall space group symbol | P 2yb |
Residual factor for all reflections | 0.0328 |
Residual factor for significantly intense reflections | 0.0281 |
Weighted residual factors for significantly intense reflections | 0.0608 |
Weighted residual factors for all reflections included in the refinement | 0.0631 |
Goodness-of-fit parameter for all reflections included in the refinement | 0.989 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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The link is: https://www.crystallography.net/4112092.html
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