Crystallography Open Database
- COD Home
- Accessing COD Data
- Add Your Data
- Documentation
Information card for entry 4115724
Preview
Coordinates | 4115724.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C53 H120 Al2 O20 P2 Si3 |
---|---|
Calculated formula | C53 H120 Al2 O20 P2 Si3 |
SMILES | P1(=[O][Al](OP(=[O][Al](O1)(O[Si](OC(C)(C)C)(OC(C)(C)C)OC(C)(C)C)O[Si](OC(C)(C)C)(OC(C)(C)C)OC(C)(C)C)(OC(C)(C)C)OC(C)(C)C)(O[Si](OC(C)(C)C)(OC(C)(C)C)OC(C)(C)C)C)(OC(C)(C)C)OC(C)(C)C |
Title of publication | An Efficient, Single-Source Molecular Precursor to Silicoaluminophosphates |
Authors of publication | Kyle L. Fujdala; T. Don Tilley |
Journal of publication | Journal of the American Chemical Society |
Year of publication | 2001 |
Journal volume | 123 |
Pages of publication | 10133 - 10134 |
a | 14.16 ± 0.002 Å |
b | 14.665 ± 0.003 Å |
c | 20.321 ± 0.003 Å |
α | 96.372 ± 0.003° |
β | 109.63 ± 0.003° |
γ | 102.714 ± 0.003° |
Cell volume | 3797.7 ± 1.1 Å3 |
Cell temperature | 155 ± 2 K |
Ambient diffraction temperature | 155 ± 2 K |
Number of distinct elements | 6 |
Space group number | 2 |
Hermann-Mauguin space group symbol | P -1 |
Hall space group symbol | -P 1 |
Residual factor for all reflections | 0.2189 |
Residual factor for significantly intense reflections | 0.0582 |
Weighted residual factors for all reflections | 0.1192 |
Weighted residual factors for significantly intense reflections | 0.089 |
Goodness-of-fit parameter for all reflections | 0.74 |
Goodness-of-fit parameter for significantly intense reflections | 1.054 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/4115724.html
All data in the COD and the database itself are dedicated to the
public domain and licensed under the
CC0
License
.
Users of the data should acknowledge the original authors of the
structural data.