Crystallography Open Database
- COD Home
- Accessing COD Data
- Add Your Data
- Documentation
Information card for entry 4116344
Preview
Coordinates | 4116344.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C6 H16 N10 Ni O6 |
---|---|
Calculated formula | C6 H16 N10 Ni O6 |
SMILES | [NH3][Ni](N1C(=O)NC(=O)NC1=O)(N1C(=O)NC(=O)NC1=O)([NH3])([NH3])[NH3] |
Title of publication | Tunable Molecular Distortion in a Nickel Complex Coupled to a Reversible Phase Transition in the Crystalline State |
Authors of publication | Larry R. Falvello; Michael A. Hitchman; Fernando Palacio; Isabel Pascual; Arthur J. Schultz; Horst Stratemeier; Milagros Tomás; Esteban P. Urriolabeitia; Dianna M. Young |
Journal of publication | Journal of the American Chemical Society |
Year of publication | 1999 |
Journal volume | 121 |
Pages of publication | 2808 - 2819 |
a | 12.0551 ± 0.0006 Å |
b | 7.2825 ± 0.0006 Å |
c | 16.0779 ± 0.0007 Å |
α | 90° |
β | 90° |
γ | 90° |
Cell volume | 1411.5 ± 0.15 Å3 |
Cell temperature | 298 ± 1 K |
Ambient diffraction temperature | 298 ± 1 K |
Number of distinct elements | 5 |
Space group number | 69 |
Hermann-Mauguin space group symbol | F m m m |
Hall space group symbol | -F 2 2 |
Residual factor for all reflections | 0.0593 |
Residual factor for significantly intense reflections | 0.0382 |
Weighted residual factors for all reflections | 0.1032 |
Weighted residual factors for significantly intense reflections | 0.0914 |
Goodness-of-fit parameter for all reflections | 1.087 |
Goodness-of-fit parameter for significantly intense reflections | 1.116 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/4116344.html
All data in the COD and the database itself are dedicated to the
public domain and licensed under the
CC0
License
.
Users of the data should acknowledge the original authors of the
structural data.