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Information card for entry 4116378
Preview
Coordinates | 4116378.cif |
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Original paper (by DOI) | HTML |
Formula | C34 H36 Cu F6 N4 P |
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Calculated formula | C34 H36 Cu F6 N4 P |
SMILES | [Cu]12([n]3c(ccc4c3c3[n]1c(ccc3cc4)C)C)[n]1c(ccc3c1c1[n]2c(ccc1cc3)C(C)(C)C)C(C)(C)C.[P](F)(F)(F)(F)(F)[F-] |
Title of publication | A Highly Emissive Heteroleptic Copper(I) Bis(phenanthroline) Complex: [Cu(dbp)(dmp)]+ (dbp = 2,9-Di-tert-butyl-1,10-phenanthroline; dmp = 2,9-Dimethyl-1,10-phenanthroline) |
Authors of publication | Mark T. Miller; Peter K. Gantzel; Timothy B. Karpishin |
Journal of publication | Journal of the American Chemical Society |
Year of publication | 1999 |
Journal volume | 121 |
Pages of publication | 4292 - 4293 |
a | 15.489 ± 0.007 Å |
b | 11.983 ± 0.007 Å |
c | 18.102 ± 0.013 Å |
α | 90° |
β | 91.23 ± 0.05° |
γ | 90° |
Cell volume | 3359 ± 3 Å3 |
Cell temperature | 295 ± 2 K |
Ambient diffraction temperature | 295 ± 2 K |
Number of distinct elements | 6 |
Space group number | 4 |
Hermann-Mauguin space group symbol | P 1 21 1 |
Hall space group symbol | P 2yb |
Residual factor for all reflections | 0.0877 |
Residual factor for significantly intense reflections | 0.0648 |
Weighted residual factors for all reflections | 0.1901 |
Weighted residual factors for significantly intense reflections | 0.1662 |
Goodness-of-fit parameter for all reflections | 1.044 |
Goodness-of-fit parameter for significantly intense reflections | 1.042 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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The link is: https://www.crystallography.net/4116378.html
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