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Information card for entry 4116379
Preview
| Coordinates | 4116379.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Chemical name | [( 3-(Bis(diphenylmethylphosphine)palldium)-tetrabismuth][Dibromo- diphenyl bismuth] |
|---|---|
| Formula | C128 H124 Bi6 Br4 P8 Pd4 |
| Calculated formula | C128 H124 Bi6 Br4 P8 Pd4 |
| Title of publication | Different Ways To Distort a Tetracapped Tetrahedron on Route to Forming an E4M4 Cubane: The Case of [E4(Pd(PPh2Me)2)4][Ph2EX2]2 (E = Sb, X = Cl; E = Bi, X = Br) |
| Authors of publication | Joseph L. Stark; Brian Harms; Ilse Guzman-Jimenez; Kenton H. Whitmire; Régis Gautier; Jean-François Halet; Jean-Yves Saillard |
| Journal of publication | Journal of the American Chemical Society |
| Year of publication | 1999 |
| Journal volume | 121 |
| Pages of publication | 4409 - 4418 |
| a | 14.395 ± 0.003 Å |
| b | 14.974 ± 0.003 Å |
| c | 32.363 ± 0.007 Å |
| α | 84.75 ± 0.03° |
| β | 77.78 ± 0.03° |
| γ | 85.59 ± 0.03° |
| Cell volume | 6777 ± 3 Å3 |
| Cell temperature | 223 ± 2 K |
| Ambient diffraction temperature | 223 ± 2 K |
| Number of distinct elements | 6 |
| Space group number | 2 |
| Hermann-Mauguin space group symbol | P -1 |
| Hall space group symbol | -P 1 |
| Residual factor for all reflections | 0.1249 |
| Residual factor for significantly intense reflections | 0.055 |
| Weighted residual factors for all reflections | 0.1658 |
| Weighted residual factors for significantly intense reflections | 0.1358 |
| Goodness-of-fit parameter for all reflections | 1.039 |
| Goodness-of-fit parameter for significantly intense reflections | 1.121 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKa |
| Has coordinates | Yes |
| Has disorder | Yes |
| Has Fobs | No |
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The link is: https://www.crystallography.net/4116379.html
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Users of the data should acknowledge the original authors of the
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