Crystallography Open Database
- COD Home
- Accessing COD Data
- Add Your Data
- Documentation
Information card for entry 4116681
Preview
| Coordinates | 4116681.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C11 H16 Cl Cr Ga N2 O5 |
|---|---|
| Calculated formula | C11 H16 Cl Cr Ga N2 O5 |
| SMILES | [Cr]([Ga]1(Cl)[N](CC[N]1(C)C)(C)C)(C#[O])(C#[O])(C#[O])(C#[O])C#[O] |
| Title of publication | Transition Metal Coordinated Al(X)L2 and Ga(X)L2 Fragments |
| Authors of publication | Roland A. Fischer; Markus M. Schulte; Jurij Weiss; Laszlo Zsolnai; Albrecht Jacobi; Gottfried Huttner; Gernot Frenking; Christian Boehme; Sergei F. Vyboishchikov |
| Journal of publication | Journal of the American Chemical Society |
| Year of publication | 1998 |
| Journal volume | 120 |
| Pages of publication | 1237 - 1248 |
| a | 9.059 ± 0.004 Å |
| b | 16.084 ± 0.007 Å |
| c | 11.835 ± 0.006 Å |
| α | 90° |
| β | 80.61 ± 0.03° |
| γ | 90° |
| Cell volume | 1701.3 ± 1.4 Å3 |
| Cell temperature | 293 ± 2 K |
| Ambient diffraction temperature | 180 K |
| Number of distinct elements | 7 |
| Space group number | 14 |
| Hermann-Mauguin space group symbol | P 1 21/n 1 |
| Hall space group symbol | -P 2yn |
| Residual factor for all reflections | 0.0476 |
| Residual factor for significantly intense reflections | 0.0368 |
| Weighted residual factors for all reflections | 0.1176 |
| Weighted residual factors for significantly intense reflections | 0.1113 |
| Goodness-of-fit parameter for all reflections | 1.242 |
| Goodness-of-fit parameter for significantly intense reflections | 1.291 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/4116681.html
All data in the COD and the database itself are dedicated to the
public domain and licensed under the
CC0
License
.
Users of the data should acknowledge the original authors of the
structural data.