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Information card for entry 4117158
Preview
| Coordinates | 4117158.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C50 H62 B N4 |
|---|---|
| Calculated formula | C50 H62 B N4 |
| SMILES | C12N(N(C(CC1)CC2)c1ccc(cc1)N1C2CCC(N1C(C)(C)C)CC2)C(C)(C)C.[B-](c1ccccc1)(c1ccccc1)(c1ccccc1)c1ccccc1 |
| Title of publication | Charge Localization in a Dihydrazine Analogue of Tetramethyl-p-phenylenediamine Radical Cation |
| Authors of publication | Stephen F. Nelsen; Rustem F. Ismagilov; Douglas R. Powell |
| Journal of publication | Journal of the American Chemical Society |
| Year of publication | 1996 |
| Journal volume | 118 |
| Pages of publication | 6313 - 6314 |
| a | 14.8524 ± 0.0002 Å |
| b | 13.9105 ± 0.0003 Å |
| c | 40.8752 ± 0.0002 Å |
| α | 90° |
| β | 90° |
| γ | 90° |
| Cell volume | 8445 ± 0.2 Å3 |
| Cell temperature | 133 ± 2 K |
| Ambient diffraction temperature | 133 ± 2 K |
| Number of distinct elements | 4 |
| Space group number | 61 |
| Hermann-Mauguin space group symbol | P b c a |
| Hall space group symbol | -P 2ac 2ab |
| Residual factor for all reflections | 0.1097 |
| Residual factor for significantly intense reflections | 0.0642 |
| Weighted residual factors for all reflections | 0.1398 |
| Weighted residual factors for significantly intense reflections | 0.1133 |
| Goodness-of-fit parameter for all reflections | 1.168 |
| Goodness-of-fit parameter for significantly intense reflections | 1.176 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/4117158.html
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Users of the data should acknowledge the original authors of the
structural data.