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Information card for entry 4117443
Preview
Coordinates | 4117443.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C37 H50 Al Mn N2 O2 |
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Calculated formula | C37 H50 Al Mn N2 O2 |
SMILES | [Mn]1234([H][AlH]5N(c6c(C(C)C)cccc6C(C)C)C(=CC(=[N]5c5c(C(C)C)cccc5C(C)C)C)C)(C#[O])([cH]5[cH]1[cH]2[c]3([cH]45)C)C#[O] |
Title of publication | σ-Alane Complexes of Chromium, Tungsten, and Manganese |
Authors of publication | Ian M. Riddlestone; Siân Edmonds; Paul A. Kaufman; Juan Urbano Baena; Joshua I. Bates; Michael J. Kelly; Amber L. Thompson; Russell Taylor; Simon Aldridge |
Journal of publication | Journal of the American Chemical Society |
Year of publication | 2012 |
Journal volume | 134 |
Pages of publication | 2551 - 2554 |
a | 10.1264 ± 0.0001 Å |
b | 20.4974 ± 0.0003 Å |
c | 16.7518 ± 0.0002 Å |
α | 90° |
β | 103.604 ± 0.0006° |
γ | 90° |
Cell volume | 3379.53 ± 0.07 Å3 |
Cell temperature | 150 K |
Ambient diffraction temperature | 150 K |
Number of distinct elements | 6 |
Space group number | 14 |
Hermann-Mauguin space group symbol | P 1 21/n 1 |
Hall space group symbol | -P 2yn |
Residual factor for all reflections | 0.0722 |
Residual factor for significantly intense reflections | 0.039 |
Weighted residual factors for all reflections | 0.0821 |
Weighted residual factors for significantly intense reflections | 0.0607 |
Weighted residual factors for all reflections included in the refinement | 0.0821 |
Goodness-of-fit parameter for all reflections included in the refinement | 0.9834 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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The link is: https://www.crystallography.net/4117443.html
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