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Information card for entry 4117444
Preview
Coordinates | 4117444.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C36 H50 Al N3 O5 W |
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Calculated formula | C36 H50 Al N3 O5 W |
SMILES | [W]([H][AlH]1[N](=C(N1c1c(cccc1C(C)C)C(C)C)N(C(C)C)C(C)C)c1c(C(C)C)cccc1C(C)C)(C#[O])(C#[O])(C#[O])(C#[O])C#[O] |
Title of publication | σ-Alane Complexes of Chromium, Tungsten, and Manganese |
Authors of publication | Ian M. Riddlestone; Siân Edmonds; Paul A. Kaufman; Juan Urbano Baena; Joshua I. Bates; Michael J. Kelly; Amber L. Thompson; Russell Taylor; Simon Aldridge |
Journal of publication | Journal of the American Chemical Society |
Year of publication | 2012 |
Journal volume | 134 |
Pages of publication | 2551 - 2554 |
a | 10.64322 ± 0.0001 Å |
b | 19.59951 ± 0.00019 Å |
c | 18.60077 ± 0.00018 Å |
α | 90° |
β | 98.4228 ± 0.0009° |
γ | 90° |
Cell volume | 3838.31 ± 0.06 Å3 |
Cell temperature | 150 K |
Ambient diffraction temperature | 150 K |
Number of distinct elements | 6 |
Space group number | 14 |
Hermann-Mauguin space group symbol | P 1 21/n 1 |
Hall space group symbol | -P 2yn |
Residual factor for all reflections | 0.0286 |
Residual factor for significantly intense reflections | 0.0272 |
Weighted residual factors for all reflections | 0.042 |
Weighted residual factors for significantly intense reflections | 0.0418 |
Weighted residual factors for all reflections included in the refinement | 0.042 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.4791 |
Diffraction radiation wavelength | 1.5418 Å |
Diffraction radiation type | CuKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/4117444.html
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Users of the data should acknowledge the original authors of the
structural data.