Information card for entry 4117837

Structure parameters

• Chemical name: [(Si{N(Dipp)SiMe3}Br)2C10H10]
• Formula: C40 H60 Br2 N2 Si4
• Calculated formula: C40 H60 Br2 N2 Si4
• SMILES: [Si@]1([Si@@](Br)(N([Si](C)(C)C)c2c(cccc2C(C)C)C(C)C)[C@H]2[C@H]1c1c(C=C2)cccc1)(Br)N([Si](C)(C)C)c1c(cccc1C(C)C)C(C)C.[Si@@]1([Si@](Br)(N([Si](C)(C)C)c2c(cccc2C(C)C)C(C)C)[C@@H]2[C@@H]1c1c(C=C2)cccc1)(Br)N([Si](C)(C)C)c1c(cccc1C(C)C)C(C)C
• Title of publication: A Stable Two-Coordinate Acyclic Silylene
• Authors of publication: Andrey V. Protchenko; Krishna Hassomal Birjkumar; Deepak Dange; Andrew D. Schwarz; Dragoslav Vidovic; Cameron Jones; Nikolas Kaltsoyannis; Philip Mountford; Simon Aldridge
• Journal of publication: Journal of the American Chemical Society
• Year of publication: 2012
• Journal volume: 134
• Pages of publication: 6500 - 6503
• a: 10.738 ± 0.002 Å
• b: 27.404 ± 0.006 Å
• c: 15.095 ± 0.003 Å
• α: 90°
• β: 104.04 ± 0.03°
• γ: 90°
• Cell volume: 4309.2 ± 1.6 ų
• Cell temperature: 150 K
• Ambient diffraction temperature: 150 K
• Number of distinct elements: 5
• Space group number: 14
• Hermann-Mauguin space group symbol: P 1 21/n 1
• Hall space group symbol: -P 2yn
• Residual factor for all reflections: 0.1439
• Residual factor for significantly intense reflections: 0.0603
• Weighted residual factors for all reflections: 0.1031
• Weighted residual factors for significantly intense reflections: 0.0597
• Weighted residual factors for all reflections included in the refinement: 0.0597
• Goodness-of-fit parameter for all reflections included in the refinement: 1.114
• Diffraction radiation wavelength: 0.71073 Å
• Diffraction radiation type: MoKα
• Has coordinates: Yes
• Has disorder: No
• Has Fobs: No