Information card for entry 4119536

Structure parameters

• Formula: F20 H3.5 Sb2.5 Xe
• Calculated formula: F20 Sb2.5 Xe
• Title of publication: [H(OXeF2)n][AsF6] and [FXeII(OXeIVF2)n][AsF6] (n= 1, 2): Examples of Xenon(IV) Hydroxide Fluoride and Oxide Fluoride Cations and the Crystal Structures of [F3Xe—FH][Sb2F11] and [H5F4][SbF6].2[F3Xe—FH][Sb2F11]
• Authors of publication: David S. Brock; Hélène P. A. Mercier; Gary J. Schrobilgen
• Journal of publication: Journal of the American Chemical Society
• Year of publication: 2013
• Journal volume: 135
• Pages of publication: 5089 - 5104
• a: 7.5604 ± 0.0008 Å
• b: 8.4967 ± 0.0009 Å
• c: 13.0169 ± 0.0014 Å
• α: 85.469 ± 0.004°
• β: 78.082 ± 0.003°
• γ: 66.35 ± 0.003°
• Cell volume: 749.44 ± 0.14 ų
• Cell temperature: 153 ± 2 K
• Ambient diffraction temperature: 153 ± 2 K
• Number of distinct elements: 4
• Space group number: 2
• Hermann-Mauguin space group symbol: P -1
• Hall space group symbol: -P 1
• Residual factor for all reflections: 0.0418
• Residual factor for significantly intense reflections: 0.0389
• Weighted residual factors for significantly intense reflections: 0.0991
• Weighted residual factors for all reflections included in the refinement: 0.1011
• Goodness-of-fit parameter for all reflections included in the refinement: 1.158
• Diffraction radiation wavelength: 0.71073 Å
• Diffraction radiation type: MoKα
• Has coordinates: Yes
• Has disorder: No
• Has Fobs: No