Information card for entry 4119537

Structure parameters

• Formula: F15 H Sb2 Xe
• Calculated formula: F15 Sb2 Xe
• SMILES: F[Sb](F)(F)([F][Sb](F)(F)(F)(F)F)(F)F.[Xe](F)(F)(F)F
• Title of publication: [H(OXeF2)n][AsF6] and [FXeII(OXeIVF2)n][AsF6] (n= 1, 2): Examples of Xenon(IV) Hydroxide Fluoride and Oxide Fluoride Cations and the Crystal Structures of [F3Xe—FH][Sb2F11] and [H5F4][SbF6].2[F3Xe—FH][Sb2F11]
• Authors of publication: David S. Brock; Hélène P. A. Mercier; Gary J. Schrobilgen
• Journal of publication: Journal of the American Chemical Society
• Year of publication: 2013
• Journal volume: 135
• Pages of publication: 5089 - 5104
• a: 13.412 ± 0.0004 Å
• b: 8.4709 ± 0.0004 Å
• c: 10.4543 ± 0.0004 Å
• α: 90°
• β: 110.493 ± 0.002°
• γ: 90°
• Cell volume: 1112.57 ± 0.08 ų
• Cell temperature: 100 ± 2 K
• Ambient diffraction temperature: 100 ± 2 K
• Number of distinct elements: 4
• Space group number: 15
• Hermann-Mauguin space group symbol: C 1 2/c 1
• Hall space group symbol: -C 2yc
• Residual factor for all reflections: 0.0321
• Residual factor for significantly intense reflections: 0.025
• Weighted residual factors for significantly intense reflections: 0.0562
• Weighted residual factors for all reflections included in the refinement: 0.0582
• Goodness-of-fit parameter for all reflections included in the refinement: 1.15
• Diffraction radiation wavelength: 0.71073 Å
• Diffraction radiation type: MoKα
• Has coordinates: Yes
• Has disorder: No
• Has Fobs: No