Information card for entry 4119538

Structure parameters

• Formula: F9 Sb Xe
• Calculated formula: F9 Sb Xe
• SMILES: [Xe]([F][Sb](F)(F)(F)(F)F)(F)(F)F
• Title of publication: [H(OXeF2)n][AsF6] and [FXeII(OXeIVF2)n][AsF6] (n= 1, 2): Examples of Xenon(IV) Hydroxide Fluoride and Oxide Fluoride Cations and the Crystal Structures of [F3Xe—FH][Sb2F11] and [H5F4][SbF6].2[F3Xe—FH][Sb2F11]
• Authors of publication: David S. Brock; Hélène P. A. Mercier; Gary J. Schrobilgen
• Journal of publication: Journal of the American Chemical Society
• Year of publication: 2013
• Journal volume: 135
• Pages of publication: 5089 - 5104
• a: 5.233 ± 0.0002 Å
• b: 15.6029 ± 0.0004 Å
• c: 9.0388 ± 0.0002 Å
• α: 90°
• β: 111.534 ± 0.001°
• γ: 90°
• Cell volume: 686.5 ± 0.04 ų
• Cell temperature: 296 ± 2 K
• Ambient diffraction temperature: 296 ± 2 K
• Number of distinct elements: 3
• Space group number: 14
• Hermann-Mauguin space group symbol: P 1 21/c 1
• Hall space group symbol: -P 2ybc
• Residual factor for all reflections: 0.0292
• Residual factor for significantly intense reflections: 0.0262
• Weighted residual factors for significantly intense reflections: 0.0604
• Weighted residual factors for all reflections included in the refinement: 0.0612
• Goodness-of-fit parameter for all reflections included in the refinement: 1.195
• Diffraction radiation wavelength: 0.71073 Å
• Diffraction radiation type: MoKα
• Has coordinates: Yes
• Has disorder: No
• Has Fobs: No