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Information card for entry 4121129
Preview
| Coordinates | 4121129.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C20 H20 F6 P S12 |
|---|---|
| Calculated formula | C19.996 H19.996 F6 P S12 |
| Title of publication | Chirality Driven Metallic versus Semiconducting Behavior in a Complete Series of Radical Cation Salts Based on Dimethyl-Ethylenedithio-Tetrathiafulvalene (DM-EDT-TTF) |
| Authors of publication | Flavia Pop; Pascale Auban-Senzier; Arkadiusz Frąckowiak; Krzysztof Ptaszyński; Iwona Olejniczak; John D. Wallis; Enric Canadell; Narcis Avarvari |
| Journal of publication | Journal of the American Chemical Society |
| Year of publication | 2013 |
| Journal volume | 135 |
| Pages of publication | 17176 - 17186 |
| a | 6.666 ± 0.0004 Å |
| b | 8.3842 ± 0.0008 Å |
| c | 15.2213 ± 0.0019 Å |
| α | 86.281 ± 0.008° |
| β | 77.464 ± 0.007° |
| γ | 67.141 ± 0.006° |
| Cell volume | 765.03 ± 0.13 Å3 |
| Cell temperature | 293 ± 2 K |
| Ambient diffraction temperature | 293 ± 2 K |
| Number of distinct elements | 5 |
| Space group number | 2 |
| Hermann-Mauguin space group symbol | P -1 |
| Hall space group symbol | -P 1 |
| Residual factor for all reflections | 0.1037 |
| Residual factor for significantly intense reflections | 0.054 |
| Weighted residual factors for significantly intense reflections | 0.1112 |
| Weighted residual factors for all reflections included in the refinement | 0.1318 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.039 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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The link is: https://www.crystallography.net/4121129.html
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Users of the data should acknowledge the original authors of the
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