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Information card for entry 4123215
Preview
Coordinates | 4123215.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C64 H64 N2 Pt Sn3 |
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Calculated formula | C64 H64 N2 Pt Sn3 |
SMILES | [PtH]([Sn](c1ccccc1)(c1ccccc1)c1ccccc1)([Sn](c1ccccc1)(c1ccccc1)c1ccccc1)([Sn](c1ccccc1)(c1ccccc1)c1ccccc1)(C#[N]C(C)(C)C)C#[N]C(C)(C)C |
Title of publication | Pendant Alkyl and Aryl Groups on Tin Control Complex Geometry and Reactivity with H2/D2 in Pt(SnR3)2(CNBu(t))2 (R = Bu(t), Pr(i), Ph, Mesityl). |
Authors of publication | Koppaka, Anjaneyulu; Zhu, Lei; Yempally, Veeranna; Isrow, Derek; Pellechia, Perry J.; Captain, Burjor |
Journal of publication | Journal of the American Chemical Society |
Year of publication | 2015 |
Journal volume | 137 |
Journal issue | 1 |
Pages of publication | 445 - 456 |
a | 13.2568 ± 0.0006 Å |
b | 18.3985 ± 0.0008 Å |
c | 24.2209 ± 0.0011 Å |
α | 90° |
β | 90° |
γ | 90° |
Cell volume | 5907.6 ± 0.5 Å3 |
Cell temperature | 296 ± 2 K |
Ambient diffraction temperature | 296 ± 2 K |
Number of distinct elements | 5 |
Space group number | 19 |
Hermann-Mauguin space group symbol | P 21 21 21 |
Hall space group symbol | P 2ac 2ab |
Residual factor for all reflections | 0.0654 |
Residual factor for significantly intense reflections | 0.0487 |
Weighted residual factors for significantly intense reflections | 0.1075 |
Weighted residual factors for all reflections included in the refinement | 0.1146 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.048 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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The link is: https://www.crystallography.net/4123215.html
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Users of the data should acknowledge the original authors of the
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