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Information card for entry 4123216
Preview
Coordinates | 4123216.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C64 H84 N2 Pt Sn2 |
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Calculated formula | C64 H84 N2 Pt Sn2 |
SMILES | C(#[N]C(C)(C)C)[Pt](C#[N]C(C)(C)C)([Sn](c1c(cc(cc1C)C)C)(c1c(cc(cc1C)C)C)c1c(cc(cc1C)C)C)[Sn](c1c(cc(cc1C)C)C)(c1c(cc(cc1C)C)C)c1c(cc(cc1C)C)C |
Title of publication | Pendant Alkyl and Aryl Groups on Tin Control Complex Geometry and Reactivity with H2/D2 in Pt(SnR3)2(CNBu(t))2 (R = Bu(t), Pr(i), Ph, Mesityl). |
Authors of publication | Koppaka, Anjaneyulu; Zhu, Lei; Yempally, Veeranna; Isrow, Derek; Pellechia, Perry J.; Captain, Burjor |
Journal of publication | Journal of the American Chemical Society |
Year of publication | 2015 |
Journal volume | 137 |
Journal issue | 1 |
Pages of publication | 445 - 456 |
a | 22.0027 ± 0.0012 Å |
b | 22.0027 ± 0.0012 Å |
c | 24.3085 ± 0.0013 Å |
α | 90° |
β | 90° |
γ | 120° |
Cell volume | 10191.6 ± 1 Å3 |
Cell temperature | 296 ± 2 K |
Ambient diffraction temperature | 296 ± 2 K |
Number of distinct elements | 5 |
Space group number | 165 |
Hermann-Mauguin space group symbol | P -3 c 1 |
Hall space group symbol | -P 3 2"c |
Residual factor for all reflections | 0.0815 |
Residual factor for significantly intense reflections | 0.0431 |
Weighted residual factors for significantly intense reflections | 0.1245 |
Weighted residual factors for all reflections included in the refinement | 0.1666 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.165 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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The link is: https://www.crystallography.net/4123216.html
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