Information card for entry 4124458

Structure parameters

• Formula: C72 H65 B F24 Ge N2 O3 W
• Calculated formula: C72 H65 B F24 Ge N2 O3 W
• SMILES: [W]1234([GeH2]=C5N(C=CN5c5c(cccc5C(C)C)C(C)C)c5c(cccc5C(C)C)C(C)C)(C#[O])(C#[O])(C#[O])[c]5([c]1([c]2([c]3([c]45C)C)C)C)C.[B-](c1cc(cc(c1)C(F)(F)F)C(F)(F)F)(c1cc(cc(c1)C(F)(F)F)C(F)(F)F)(c1cc(cc(c1)C(F)(F)F)C(F)(F)F)c1cc(cc(c1)C(F)(F)F)C(F)(F)F
• Title of publication: Insertion of a Cationic Metallogermylene into E-H Bonds (E = H, B, Si).
• Authors of publication: Inomata, Koya; Watanabe, Takahito; Miyazaki, Yoshikazu; Tobita, Hiromi
• Journal of publication: Journal of the American Chemical Society
• Year of publication: 2015
• Journal volume: 137
• Journal issue: 37
• Pages of publication: 11935 - 11937
• a: 14.915 ± 0.0004 Å
• b: 18.5815 ± 0.0005 Å
• c: 27.645 ± 0.0005 Å
• α: 96.535 ± 0.0005°
• β: 91.7439 ± 0.0008°
• γ: 102.01 ± 0.0006°
• Cell volume: 7433.7 ± 0.3 ų
• Cell temperature: 140 ± 2 K
• Ambient diffraction temperature: 140 ± 2 K
• Number of distinct elements: 8
• Space group number: 2
• Hermann-Mauguin space group symbol: P -1
• Hall space group symbol: -P 1
• Residual factor for all reflections: 0.0998
• Residual factor for significantly intense reflections: 0.0728
• Weighted residual factors for significantly intense reflections: 0.1612
• Weighted residual factors for all reflections included in the refinement: 0.1756
• Goodness-of-fit parameter for all reflections included in the refinement: 1.138
• Diffraction radiation wavelength: 0.71073 Å
• Diffraction radiation type: MoKα
• Has coordinates: Yes
• Has disorder: No
• Has Fobs: No