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Information card for entry 4124892
Preview
Coordinates | 4124892.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C16 H11 F20 Li O6 S |
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Calculated formula | C16 H3 F20 Li O6 S |
SMILES | [S-]12OC(c3c1c(ccc3)C(C(F)(F)C(F)(F)F)(C(F)(F)C(F)(F)F)O2)(C(F)(F)C(F)(F)F)C(F)(F)C(F)(F)F.[Li]([OH2])([OH2])([OH2])[OH2] |
Title of publication | Isolation of Hypervalent Group-16 Radicals and Their Application in Organic-Radical Batteries. |
Authors of publication | Imada, Yasuyuki; Nakano, Hideyuki; Furukawa, Ko; Kishi, Ryohei; Nakano, Masayoshi; Maruyama, Hitoshi; Nakamoto, Masaaki; Sekiguchi, Akira; Ogawa, Masahiro; Ohta, Toshiaki; Yamamoto, Yohsuke |
Journal of publication | Journal of the American Chemical Society |
Year of publication | 2016 |
Journal volume | 138 |
Journal issue | 2 |
Pages of publication | 479 - 482 |
a | 11.4151 ± 0.0011 Å |
b | 14.6893 ± 0.0014 Å |
c | 16.2421 ± 0.0016 Å |
α | 70.277 ± 0.001° |
β | 78.78 ± 0.001° |
γ | 73.648 ± 0.001° |
Cell volume | 2445 ± 0.4 Å3 |
Cell temperature | 173 ± 2 K |
Ambient diffraction temperature | 173 ± 2 K |
Number of distinct elements | 6 |
Space group number | 2 |
Hermann-Mauguin space group symbol | P -1 |
Hall space group symbol | -P 1 |
Residual factor for all reflections | 0.0508 |
Residual factor for significantly intense reflections | 0.0425 |
Weighted residual factors for significantly intense reflections | 0.1151 |
Weighted residual factors for all reflections included in the refinement | 0.1228 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.024 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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The link is: https://www.crystallography.net/4124892.html
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Users of the data should acknowledge the original authors of the
structural data.