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Information card for entry 4124893
Preview
Coordinates | 4124893.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C24 H23 F20 N O2 Se |
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Calculated formula | C24 H23 F20 N O2 Se |
SMILES | [Se-]12OC(c3c2c(C(O1)(C(F)(F)C(F)(F)F)C(F)(F)C(F)(F)F)ccc3)(C(F)(F)C(F)(F)F)C(F)(F)C(F)(F)F.[N+](CC)(CC)(CC)CC |
Title of publication | Isolation of Hypervalent Group-16 Radicals and Their Application in Organic-Radical Batteries. |
Authors of publication | Imada, Yasuyuki; Nakano, Hideyuki; Furukawa, Ko; Kishi, Ryohei; Nakano, Masayoshi; Maruyama, Hitoshi; Nakamoto, Masaaki; Sekiguchi, Akira; Ogawa, Masahiro; Ohta, Toshiaki; Yamamoto, Yohsuke |
Journal of publication | Journal of the American Chemical Society |
Year of publication | 2016 |
Journal volume | 138 |
Journal issue | 2 |
Pages of publication | 479 - 482 |
a | 11.6841 ± 0.0008 Å |
b | 15.377 ± 0.001 Å |
c | 17.5469 ± 0.0012 Å |
α | 90° |
β | 109.009 ± 0.002° |
γ | 90° |
Cell volume | 2980.7 ± 0.3 Å3 |
Cell temperature | 173 ± 2 K |
Ambient diffraction temperature | 173 ± 2 K |
Number of distinct elements | 6 |
Space group number | 14 |
Hermann-Mauguin space group symbol | P 1 21/n 1 |
Hall space group symbol | -P 2yn |
Residual factor for all reflections | 0.063 |
Residual factor for significantly intense reflections | 0.043 |
Weighted residual factors for significantly intense reflections | 0.0963 |
Weighted residual factors for all reflections included in the refinement | 0.1062 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.034 |
Diffraction radiation wavelength | 0.71075 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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The link is: https://www.crystallography.net/4124893.html
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Users of the data should acknowledge the original authors of the
structural data.