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Information card for entry 4124893
Preview
| Coordinates | 4124893.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C24 H23 F20 N O2 Se |
|---|---|
| Calculated formula | C24 H23 F20 N O2 Se |
| SMILES | [Se-]12OC(c3c2c(C(O1)(C(F)(F)C(F)(F)F)C(F)(F)C(F)(F)F)ccc3)(C(F)(F)C(F)(F)F)C(F)(F)C(F)(F)F.[N+](CC)(CC)(CC)CC |
| Title of publication | Isolation of Hypervalent Group-16 Radicals and Their Application in Organic-Radical Batteries. |
| Authors of publication | Imada, Yasuyuki; Nakano, Hideyuki; Furukawa, Ko; Kishi, Ryohei; Nakano, Masayoshi; Maruyama, Hitoshi; Nakamoto, Masaaki; Sekiguchi, Akira; Ogawa, Masahiro; Ohta, Toshiaki; Yamamoto, Yohsuke |
| Journal of publication | Journal of the American Chemical Society |
| Year of publication | 2016 |
| Journal volume | 138 |
| Journal issue | 2 |
| Pages of publication | 479 - 482 |
| a | 11.6841 ± 0.0008 Å |
| b | 15.377 ± 0.001 Å |
| c | 17.5469 ± 0.0012 Å |
| α | 90° |
| β | 109.009 ± 0.002° |
| γ | 90° |
| Cell volume | 2980.7 ± 0.3 Å3 |
| Cell temperature | 173 ± 2 K |
| Ambient diffraction temperature | 173 ± 2 K |
| Number of distinct elements | 6 |
| Space group number | 14 |
| Hermann-Mauguin space group symbol | P 1 21/n 1 |
| Hall space group symbol | -P 2yn |
| Residual factor for all reflections | 0.063 |
| Residual factor for significantly intense reflections | 0.043 |
| Weighted residual factors for significantly intense reflections | 0.0963 |
| Weighted residual factors for all reflections included in the refinement | 0.1062 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.034 |
| Diffraction radiation wavelength | 0.71075 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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The link is: https://www.crystallography.net/4124893.html
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Users of the data should acknowledge the original authors of the
structural data.