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Information card for entry 4124894
Preview
| Coordinates | 4124894.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C24 H23 F20 Li O6 Se |
|---|---|
| Calculated formula | C24 H19 F20 Li O6 Se |
| Title of publication | Isolation of Hypervalent Group-16 Radicals and Their Application in Organic-Radical Batteries. |
| Authors of publication | Imada, Yasuyuki; Nakano, Hideyuki; Furukawa, Ko; Kishi, Ryohei; Nakano, Masayoshi; Maruyama, Hitoshi; Nakamoto, Masaaki; Sekiguchi, Akira; Ogawa, Masahiro; Ohta, Toshiaki; Yamamoto, Yohsuke |
| Journal of publication | Journal of the American Chemical Society |
| Year of publication | 2016 |
| Journal volume | 138 |
| Journal issue | 2 |
| Pages of publication | 479 - 482 |
| a | 11.526 ± 0.002 Å |
| b | 16.241 ± 0.003 Å |
| c | 18.58 ± 0.003 Å |
| α | 88.205 ± 0.002° |
| β | 80.618 ± 0.002° |
| γ | 70.946 ± 0.002° |
| Cell volume | 3242.6 ± 1 Å3 |
| Cell temperature | 173 ± 2 K |
| Ambient diffraction temperature | 173 ± 2 K |
| Number of distinct elements | 6 |
| Space group number | 2 |
| Hermann-Mauguin space group symbol | P -1 |
| Hall space group symbol | -P 1 |
| Residual factor for all reflections | 0.0584 |
| Residual factor for significantly intense reflections | 0.0498 |
| Weighted residual factors for significantly intense reflections | 0.1364 |
| Weighted residual factors for all reflections included in the refinement | 0.1422 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.02 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | Yes |
| Has Fobs | No |
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