Information card for entry 4126552

Structure parameters

• Formula: Cs3 Eu F2 O10 Si4
• Calculated formula: Cs3 Eu F2 O10 Si4
• Title of publication: Observation of Intense X-ray Scintillation in a Family of Mixed Anion Silicates, Cs3RESi4O10F2 (RE = Y, Eu-Lu), Obtained via an Enhanced Flux Crystal Growth Technique.
• Authors of publication: Morrison, Gregory; Latshaw, Allison M.; Spagnuolo, Nicholas R.; Zur Loye, Hans-Conrad
• Journal of publication: Journal of the American Chemical Society
• Year of publication: 2017
• a: 7.1027 ± 0.0003 Å
• b: 7.1471 ± 0.0003 Å
• c: 16.2743 ± 0.0007 Å
• α: 95.733 ± 0.002°
• β: 89.969 ± 0.001°
• γ: 119.789 ± 0.001°
• Cell volume: 712.24 ± 0.05 ų
• Cell temperature: 302 ± 2 K
• Ambient diffraction temperature: 302 K
• Number of distinct elements: 5
• Space group number: 2
• Hermann-Mauguin space group symbol: P -1
• Hall space group symbol: -P 1
• Residual factor for all reflections: 0.0324
• Residual factor for significantly intense reflections: 0.0309
• Weighted residual factors for significantly intense reflections: 0.0797
• Weighted residual factors for all reflections included in the refinement: 0.0805
• Goodness-of-fit parameter for all reflections included in the refinement: 1.118
• Diffraction radiation wavelength: 0.71073 Å
• Diffraction radiation type: MoKα
• Has coordinates: Yes
• Has disorder: No
• Has Fobs: No