Crystallography Open Database

Information card for entry 4126553

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Coordinates	4126553.cif
Original paper (by DOI)	HTML

Structure parameters

Formula	Cs3 F2 O10 Si4 Y
Calculated formula	Cs3 F2 O10 Si4 Y
Title of publication	Observation of Intense X-ray Scintillation in a Family of Mixed Anion Silicates, Cs3RESi4O10F2 (RE = Y, Eu-Lu), Obtained via an Enhanced Flux Crystal Growth Technique.
Authors of publication	Morrison, Gregory; Latshaw, Allison M.; Spagnuolo, Nicholas R.; Zur Loye, Hans-Conrad
Journal of publication	Journal of the American Chemical Society
Year of publication	2017
a	7.0722 ± 0.0003 Å
b	7.1249 ± 0.0003 Å
c	16.1502 ± 0.0007 Å
α	95.801 ± 0.001°
β	90.115 ± 0.001°
γ	119.746 ± 0.001°
Cell volume	701.66 ± 0.05 Å³
Cell temperature	302 ± 2 K
Ambient diffraction temperature	302 K
Number of distinct elements	5
Space group number	2
Hermann-Mauguin space group symbol	P -1
Hall space group symbol	-P 1
Residual factor for all reflections	0.0261
Residual factor for significantly intense reflections	0.0258
Weighted residual factors for significantly intense reflections	0.0595
Weighted residual factors for all reflections included in the refinement	0.0596
Goodness-of-fit parameter for all reflections included in the refinement	1.141
Diffraction radiation wavelength	0.71073 Å
Diffraction radiation type	MoKα
Has coordinates	Yes
Has disorder	No
Has F_obs	No

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