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Information card for entry 4127552
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Coordinates | 4127552.cif |
---|---|
Original paper (by DOI) | HTML |
Chemical name | {[BP2]Co(dmap)}Si{H2Co[BP3[) |
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Formula | C54 H99 B2 Co2 N2 P5 Si |
Calculated formula | C54 H99 B2 Co2 N2 P5 Si |
Title of publication | Activations of all Bonds to Silicon (Si-H, Si-C) in a Silane with Extrusion of [CoSiCo] Silicide Cores. |
Authors of publication | Handford, Rex C.; Smith, Patrick W.; Tilley, T. Don |
Journal of publication | Journal of the American Chemical Society |
Year of publication | 2019 |
Journal volume | 141 |
Journal issue | 22 |
Pages of publication | 8769 - 8772 |
a | 12.1123 ± 0.0006 Å |
b | 21.5468 ± 0.0011 Å |
c | 22.5752 ± 0.0011 Å |
α | 90° |
β | 90° |
γ | 90° |
Cell volume | 5891.7 ± 0.5 Å3 |
Cell temperature | 100 K |
Ambient diffraction temperature | 100 K |
Number of distinct elements | 7 |
Space group number | 19 |
Hermann-Mauguin space group symbol | P 21 21 21 |
Hall space group symbol | P 2ac 2ab |
Residual factor for all reflections | 0.0518 |
Residual factor for significantly intense reflections | 0.0413 |
Weighted residual factors for significantly intense reflections | 0.0936 |
Weighted residual factors for all reflections included in the refinement | 0.0988 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.023 |
Diffraction radiation probe | x-ray |
Diffraction radiation wavelength | 0.7288 Å |
Diffraction radiation type | synchrotron |
Has coordinates | Yes |
Has disorder | Yes |
Has Fobs | No |
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The link is: https://www.crystallography.net/4127552.html
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