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Information card for entry 4129736
Preview
Coordinates | 4129736.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C30 H42 Ni O2 P2 Si |
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Calculated formula | C30 H42 Ni O2 P2 Si |
SMILES | c12c3cccc1O[P](C(C)C)(C(C)C)[Ni]2([P](C(C)C)(C(C)C)O3)[SiH](c1ccccc1)c1ccccc1 |
Title of publication | Reactions of Phenylhydrosilanes with Pincer-Nickel Complexes: Evidence for New Si-O and Si-C Bond Formation Pathways. |
Authors of publication | Hao, Jingjun; Vabre, Boris; Zargarian, Davit |
Journal of publication | Journal of the American Chemical Society |
Year of publication | 2015 |
Journal volume | 137 |
Journal issue | 48 |
Pages of publication | 15287 - 15298 |
a | 11.832 ± 0.0001 Å |
b | 20.1684 ± 0.0002 Å |
c | 25.0196 ± 0.0003 Å |
α | 90° |
β | 90° |
γ | 90° |
Cell volume | 5970.49 ± 0.11 Å3 |
Cell temperature | 100 ± 2 K |
Ambient diffraction temperature | 100 ± 2 K |
Number of distinct elements | 6 |
Space group number | 61 |
Hermann-Mauguin space group symbol | P b c a |
Hall space group symbol | -P 2ac 2ab |
Residual factor for all reflections | 0.0305 |
Residual factor for significantly intense reflections | 0.0279 |
Weighted residual factors for significantly intense reflections | 0.0768 |
Weighted residual factors for all reflections included in the refinement | 0.079 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.016 |
Diffraction radiation wavelength | 1.54178 Å |
Diffraction radiation type | CuKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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