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Information card for entry 4132627
Preview
| Coordinates | 4132627.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C20.5 H25 Cl2 Cu N2 S |
|---|---|
| Calculated formula | C20.5 H25 Cl2 Cu N2 S |
| Title of publication | In Situ Formation of N-Heterocyclic Carbene-Bound Single-Molecule Junctions. |
| Authors of publication | Doud, Evan A.; Inkpen, Michael S.; Lovat, Giacomo; Montes, Enrique; Paley, Daniel W.; Steigerwald, Michael L.; Vázquez, Héctor; Venkataraman, Latha; Roy, Xavier |
| Journal of publication | Journal of the American Chemical Society |
| Year of publication | 2018 |
| Journal volume | 140 |
| Journal issue | 28 |
| Pages of publication | 8944 - 8949 |
| a | 12.3475 ± 0.0008 Å |
| b | 7.5762 ± 0.0007 Å |
| c | 23.0412 ± 0.0016 Å |
| α | 90° |
| β | 104.263 ± 0.007° |
| γ | 90° |
| Cell volume | 2089 ± 0.3 Å3 |
| Cell temperature | 100 ± 0.2 K |
| Ambient diffraction temperature | 100 ± 0.2 K |
| Number of distinct elements | 6 |
| Space group number | 14 |
| Hermann-Mauguin space group symbol | P 1 21/c 1 |
| Hall space group symbol | -P 2ybc |
| Residual factor for all reflections | 0.1138 |
| Residual factor for significantly intense reflections | 0.068 |
| Weighted residual factors for significantly intense reflections | 0.1294 |
| Weighted residual factors for all reflections included in the refinement | 0.1621 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.062 |
| Diffraction radiation probe | x-ray |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | Yes |
| Has Fobs | No |
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