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Information card for entry 4132628
Preview
| Coordinates | 4132628.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C20 H24 Au Cl N2 S |
|---|---|
| Calculated formula | C20 H24 Au Cl N2 S |
| SMILES | [Au](Cl)=C1N(c2c(N1C(C)C)ccc(c1ccc(SC)cc1)c2)C(C)C |
| Title of publication | In Situ Formation of N-Heterocyclic Carbene-Bound Single-Molecule Junctions. |
| Authors of publication | Doud, Evan A.; Inkpen, Michael S.; Lovat, Giacomo; Montes, Enrique; Paley, Daniel W.; Steigerwald, Michael L.; Vázquez, Héctor; Venkataraman, Latha; Roy, Xavier |
| Journal of publication | Journal of the American Chemical Society |
| Year of publication | 2018 |
| Journal volume | 140 |
| Journal issue | 28 |
| Pages of publication | 8944 - 8949 |
| a | 8.5453 ± 0.0003 Å |
| b | 10.0951 ± 0.0003 Å |
| c | 12.3151 ± 0.0004 Å |
| α | 104.024 ± 0.003° |
| β | 106.985 ± 0.003° |
| γ | 94.21 ± 0.003° |
| Cell volume | 973.77 ± 0.06 Å3 |
| Cell temperature | 100 ± 0.2 K |
| Ambient diffraction temperature | 100 ± 0.2 K |
| Number of distinct elements | 6 |
| Space group number | 2 |
| Hermann-Mauguin space group symbol | P -1 |
| Hall space group symbol | -P 1 |
| Residual factor for all reflections | 0.0241 |
| Residual factor for significantly intense reflections | 0.0239 |
| Weighted residual factors for significantly intense reflections | 0.0614 |
| Weighted residual factors for all reflections included in the refinement | 0.0616 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.115 |
| Diffraction radiation probe | x-ray |
| Diffraction radiation wavelength | 1.54184 Å |
| Diffraction radiation type | CuKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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