Crystallography Open Database
- COD Home
- Accessing COD Data
- Add Your Data
- Documentation
Information card for entry 4133647
Preview
| Coordinates | 4133647.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C28 H52 N4 Si Yb |
|---|---|
| Calculated formula | C28 H52 N4 Si Yb |
| SMILES | [Yb]123([N](=C(C)C=C(N1CC[N]2(CC[N]3(C)C)C)C)c1c(cccc1C(C)C)C(C)C)C[Si](C)(C)C |
| Title of publication | Divalent Ytterbium Complex-Catalyzed Homo- and Cross-Coupling of Primary Arylsilanes. |
| Authors of publication | Liu, Xiaojuan; Xiang, Li; Louyriac, Elisa; Maron, Laurent; Leng, Xuebing; Chen, Yaofeng |
| Journal of publication | Journal of the American Chemical Society |
| Year of publication | 2019 |
| Journal volume | 141 |
| Journal issue | 1 |
| Pages of publication | 138 - 142 |
| a | 14.361 ± 0.003 Å |
| b | 20.959 ± 0.004 Å |
| c | 21.535 ± 0.004 Å |
| α | 90° |
| β | 90° |
| γ | 90° |
| Cell volume | 6482 ± 2 Å3 |
| Cell temperature | 296 ± 2 K |
| Ambient diffraction temperature | 296 K |
| Number of distinct elements | 5 |
| Space group number | 61 |
| Hermann-Mauguin space group symbol | P b c a |
| Hall space group symbol | -P 2ac 2ab |
| Residual factor for all reflections | 0.0992 |
| Residual factor for significantly intense reflections | 0.0375 |
| Weighted residual factors for significantly intense reflections | 0.0654 |
| Weighted residual factors for all reflections included in the refinement | 0.0832 |
| Goodness-of-fit parameter for all reflections included in the refinement | 0.982 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/4133647.html
All data in the COD and the database itself are dedicated to the
public domain and licensed under the
CC0
License
.
Users of the data should acknowledge the original authors of the
structural data.