Information card for entry 4133648

Structure parameters

• Formula: C32 H63 N4 Si2 Yb
• Calculated formula: C32 H63 N4 Si2 Yb
• SMILES: [Yb]123([N](=C(C)C=C(N1CC[N]2(CC[N]3(C)C)C)C)c1c(cccc1C(C)C)C(C)C)(C[Si](C)(C)C)C[Si](C)(C)C
• Title of publication: Divalent Ytterbium Complex-Catalyzed Homo- and Cross-Coupling of Primary Arylsilanes.
• Authors of publication: Liu, Xiaojuan; Xiang, Li; Louyriac, Elisa; Maron, Laurent; Leng, Xuebing; Chen, Yaofeng
• Journal of publication: Journal of the American Chemical Society
• Year of publication: 2019
• Journal volume: 141
• Journal issue: 1
• Pages of publication: 138 - 142
• a: 10.8609 ± 0.0004 Å
• b: 11.002 ± 0.0004 Å
• c: 18.3602 ± 0.0006 Å
• α: 77.331 ± 0.002°
• β: 83.437 ± 0.002°
• γ: 60.677 ± 0.002°
• Cell volume: 1866.16 ± 0.12 ų
• Cell temperature: 182 ± 2 K
• Ambient diffraction temperature: 182.62 K
• Number of distinct elements: 5
• Space group number: 2
• Hermann-Mauguin space group symbol: P -1
• Hall space group symbol: -P 1
• Residual factor for all reflections: 0.0314
• Residual factor for significantly intense reflections: 0.0291
• Weighted residual factors for significantly intense reflections: 0.0759
• Weighted residual factors for all reflections included in the refinement: 0.0773
• Goodness-of-fit parameter for all reflections included in the refinement: 1.077
• Diffraction radiation wavelength: 1.34139 Å
• Diffraction radiation type: GaKα
• Has coordinates: Yes
• Has disorder: No
• Has Fobs: No